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EN Standards: EN60749-34:2004

Standard No EN60749-34:2004
Title of Standard Semiconductor devices. Mechanical and climatic test methods. Power cycling
ISBN 058043974 7
Date of Publication 22/06/04
Approx Pages 12
Description Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Thermal stress, Stress, Stress analysis, Power losses, Low voltage, Electrical testing, Destructive testing
Cross references IEC 60747, EN60747, IEC 60747-1, IEC 60747-2, IEC 60747-6, IEC 60748, IEC 60749-3, EN60749-3:2002, IEC 60749-23, EN60749-23:2004
International Equiv (If Applicable ) EN60749-34:2004 IEC 60749-34:2004
Replaces Standards :
Replacement Notes
Now Replaced By
Replaced by Notes
Committee Ref EPL/47

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