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EN Standards: EN60749-20:2003

Standard No EN60749-20:2003
Title of Standard Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
ISBN 058042197 X
Date of Publication 07/07/03
Approx Pages 28
Description Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Plastics, Encapsulated, Surface mounting devices, Thermal testing, Soldering, Solderability testing, Damp-heat tests
Cross references IEC 60068-2-20:1979, IEC 60749-3, CENELEC HD 323.2.20 S3:1988, EN60749-3:2002
International Equiv (If Applicable ) EN60749-20:2003 IEC 60749-20:2002
Replaces Standards : BS EN60749:1999
Replacement Notes Partially replaces BS EN60749:1999.
Now Replaced By
Replaced by Notes
Committee Ref EPL/47

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