EN60749-14:2003

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EN Standards: EN60749-14:2003



Standard No EN60749-14:2003
Title of Standard Semiconductor devices. Mechanical and climatic test methods. Robustness of terminations (lead integrity)
ISBN 058043082 0
Date of Publication 15/12/03
Approx Pages 18
Description Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Semiconductors, Interfaces, Defects, Tensile testing, Bend testing, Fatigue testing, Torque, Destructive testing, Qualific
Cross references IEC 60749-8, EN60749-8:2003
International Equiv (If Applicable ) EN60749-14:2003 IEC 60749-14:2003
Replaces Standards : BS EN60749:1999
Replacement Notes Partially replaces BS EN60749:1999.
Now Replaced By
Replaced by Notes
Committee Ref EPL/47


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