EN60749-1:2003

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EN Standards: EN60749-1:2003



Standard No EN60749-1:2003
Title of Standard Semiconductor devices. Mechanical and climatic test methods. General
ISBN 058042198 8
Date of Publication 07/07/03
Approx Pages 12
Description Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Testing conditions
Cross references IEC 60050, IEC 60747, IEC 60748, EN60747
International Equiv (If Applicable ) EN60749-1:2003 IEC 60749-1:2002
Replaces Standards : BS EN60749:1999
Replacement Notes Partially replaces BS EN60749:1999.
Now Replaced By
Replaced by Notes
Committee Ref EPL/47


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