EN60749:1999

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EN Standards: EN60749:1999



Standard No EN60749:1999
Title of Standard Semiconductor devices. Mechanical and climatic test methods
ISBN 058032151 7
Date of Publication 15/04/99
Approx Pages 80
Description Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Stress, Visual inspection (testing), Dimensional measurement, Test equipment, Test specimens, SpecimENpreparation, Testing conditi
Cross references CENELEC HD 323.2.20 S3:1988, IEC 60068-1:1988, EN60068-1:1994, IEC 60068-2-3:1985, CENELEC HD 323.2.3 S3:1987, IEC 60068-2-6:1995, IEC 60068-2-6:1995/Corrigendum:1995, EN60068-2-6:1995, IEC 60068-2-7:1983, EN60068-2-7:1993, IEC 60068-2-11:1981, CENELEC
International Equiv (If Applicable ) EN60749:1999 IEC 60749:1996
Replaces Standards : BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6493-3:1985 BS6
Replacement Notes
Now Replaced By BS EN60749-1:2003 BS EN60749-10:2002 BS EN60749-11:2002 BS EN60749-12:2002 BS EN60749-13:2002 BS EN60749-14:2003 BS EN60749-15:2003 BS EN60749-19:2003 BS EN60749-2:2002 BS EN60749-20:2003 BS EN60749-22:2003 BS EN60749-25:2003 BS EN60749-3:200
Replaced by Notes Partially replaced by Parts 1-15, 19-20, 22, 25, 31, 32 and 36 of BS EN60749 and remains current.
Committee Ref EPL/47


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