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| Standard No |
BS CECC 90112:1987 |
| Title of Standard |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
| ISBN |
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| Date of Publication |
15/08/87 |
| Approx Pages |
38 |
| Description |
Electronic equipment and components, Specification (approval), Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Detail specification, Quality control, Statistical quality control, Monolithic integrated circuits, Digit |
| Cross references |
BS 2011:Part 2.1Db, BS 3939:Part 12, BS 9000:Part 2, BS CECC 90000, BS CECC 90100, IEC 747 |
| International Equiv (If Applicable ) |
CECC 90112:1986 |
| Replaces Standards : |
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| Replacement Notes |
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| Now Replaced By |
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| Replaced by Notes |
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| Committee Ref |
EPL/47 |
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